Editor-in-Chief, IIE Transactions, January 1997-2001.
Liu, X., Li, J., Al-Khalifa, K. N., Hamouda, A. S., Coit, D. W. and Elsayed, E. A., "Condition-based Maintenance for Continuously Monitored Degrading Systems with Multiple Failure Modes," IIE Transactions on Quality and Reliability Engineering, 45, 4, 422-435, 2013.
Elsayed, E. A., Reliability Engineering, John Wiley and Sons, 2012.
Elsayed, E. A., "Overview of Reliability Testing," IEEE Transactions on Reliability, Vol. 61, No. 2, pp. 282-291, 2012.
Zhu, Y. and Elsayed, E. A., "Optimal Design of Accelerated Life Testing Plans under Progressive Censoring," Accepted in IIE Transactions on Quality and Reliability Engineering, 2012.
Elsayed, E. A. and Basily, B.B., Technology For Continuous Folding of Sheet Materials into a Honeycomb-Like Configuration, Patent 7,758,487, July 20,2010.
Elsayed A. Elsayed
Distinguished Professor and Interim Chairman
Ph.D., 1976, University of Windsor
Systems reliability engineering, accelerated life testing, reliability prediction models, design of test plans, on-line quality engineering, sheet folding theory and technology as well as their applications in panel designs.
Center for Quality and Reliability Engineering (QRE)
Elsayed A. Elsayed is Professor of Industrial and Systems Engineering, Rutgers University, and the Director of the NSF/ Industry/ University Co-operative Research Center for Quality and Reliability Engineering with site Centers at both Rutgers University and Qatar University. His research has been funded by the Department of Defense, Federal Aviation Administration, the National Science Foundation and industry. Dr. Elsayed has been a consultant for AT&T Bell Laboratories, Ingersoll-Rand, Johnson & Johnson, Personal Products, AT&T Communications, BellCore and other companies. He served as the Editor-in-Chief of the IIE Transactions and the Editor of the IIE Transactions on Quality and Reliability Engineering. He is also the Editor of the International Journal of Reliability, Quality and Safety Engineering.
Dr. Elsayed is a Fellow of both the Institute of Industrial Engineers (IIE) and ASME. He is the recipient of many awards including David F. Baker Research Award of the Institute of Industrial Engineers for research contributions to the discipline of Industrial Engineering. He is a co-author of Quality Engineering in Production Systems, McGraw Hill Book Company, 1989. He is also the author of Reliability Engineering, John Wiley and Sons, 2012. These two books received the 1990 and 1997 IIE Joint Publishers Book-of the-Year Award respectively. The second edition of Reliability Engineering (Wiley) was awarded the 2013 Outstanding IIE Publication. He is the recipient of the Senior Fulbright Award 2011 and Thomas Alva Edison Award for US Patent 7,115,089 B2.